期刊论文

中文

电子与信息学报

1009-5896

2024

46

01

362-372

国家自然科学基金(62172058)； 湖南省自然科学基金(2022JJ10052,2022JJ30624)~~；

本校为第一机构

随着CMOS器件特征尺寸进入纳米量级,因高能粒子辐射等造成的电路失效问题日益严重,给电路可靠性带来严峻挑战。现阶段,准确评估集成电路可靠性,并以此为依据对电路进行容错加固,以提高电路系统可靠性变得刻不容缓。然而,由于逻辑...展开更多 随着CMOS器件特征尺寸进入纳米量级,因高能粒子辐射等造成的电路失效问题日益严重,给电路可靠性带来严峻挑战。现阶段,准确评估集成电路可靠性,并以此为依据对电路进行容错加固,以提高电路系统可靠性变得刻不容缓。然而,由于逻辑电路中存在大量扇出重汇聚结构,由此引发的信号相关性导致可靠性评估与敏感单元定位面临困难。该文提出一种基于相关性分离的逻辑...

With the feature size of CMOS device entering the nanoscale,the circuit failure issue caused by high-energy particle radiation is becoming more and more serious,which brings severe challenges to the circuit reliability.At present,it is urgent to accurately evaluate the ...MORE With the feature size of CMOS device entering the nanoscale,the circuit failure issue caused by high-energy particle radiation is becoming more and more serious,which brings severe challenges to the circuit reliability.At present,it is urgent to accurately evaluate the reliability of the integrated circuit and reinforce ...