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A new on-line measurement system of dielectric loss angle for high voltage capacitive apparatus

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成果类型:
期刊论文、会议论文
作者:
Li Zewen*;Chu Xianghui;Zeng Xiangjun;Chen Nan
通讯作者:
Li Zewen
作者机构:
[Li Zewen; Zeng Xiangjun; Chen Nan; Chu Xianghui] Changsha Univ Sci & Technol, Sch Elect & Info Engn, Changsha 410076, Hunan, Peoples R China.
通讯机构:
[Li Zewen] C
Changsha Univ Sci & Technol, Sch Elect & Info Engn, Changsha 410076, Hunan, Peoples R China.
语种:
英文
关键词:
Dielectric loss;FPGA;Online monitoring;Zero cross point comparing method
期刊:
Industry Applications Society. IEEE - IAS Annual Meeting. Conference Record
ISSN:
0197-2618
年:
2007
页码:
1512-1516
会议名称:
42nd Annual Meeting of the IEEE-Industry-Applications-Society
会议论文集名称:
IEEE INDUSTRY APPLICATIONS SOCIETY ANNUAL MEETING
会议时间:
SEP 23-27, 2007
会议地点:
New Orleans, LA
会议主办单位:
[Li Zewen;Chu Xianghui;Zeng Xiangjun;Chen Nan] Changsha Univ Sci & Technol, Sch Elect & Info Engn, Changsha 410076, Hunan, Peoples R China.
会议赞助商:
IEEE Ind Applicat Soc
出版地:
345 E 47TH ST, NEW YORK, NY 10017 USA
出版者:
IEEE
ISBN:
978-1-4244-1260-0
机构署名:
本校为第一且通讯机构
院系归属:
电气与信息工程学院
摘要:
A new on-line measurement system of dielectric loss angle (δ) with FPGA for high voltage capacitive apparatus is presented in this paper. By using double polarity zero crossing point comparing method for measuring phase difference, system frequency measurement and measurement error adaptive corrected with FPGA is adopted. Tests results show that the measuring system based on FPGA is with higher precision, stabilit...

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