Metallized film capacitors (MFCs) are valued for their ability to withstand high-electric-fields, yet they face short-term failure risks when subjected to overvoltage-induced self-healing (SH). This paper presents a monitoring method designed to address the challenges posed by multiple instances of SH in pulsed power applications. Traditional capacitance estimation using sampled current during SH is hindered by the significant arc current. To address this, the study explores the dynamic interplay between sampling current, arc current, and MFC current throughout the SH process. The introduction...
