版权说明 操作指南
首页 > 成果 > 详情

Multi-dimensional accumulation gate LDMOS with ultra-low specific on-resistance

认领
导出
Link by DOI
反馈
分享
QQ微信 微博
成果类型:
期刊论文
作者:
Wu, Lijuan;Yang, Gang;Liu, Mengjiao;Liang, Jiahui;Zhang, Mengyuan;...
通讯作者:
Wu, LJ
作者机构:
[Zhang, Tengfei; Wu, LJ; Liang, Jiahui; Wu, Lijuan; Zhang, Mengyuan; Yang, Gang; Liu, Mengjiao] Changsha Univ Sci & Technol, Sch Phys & Elect Sci, Hunan Prov Key Lab Flexible Elect Mat Genome Engn, Changsha 410114, Peoples R China.
通讯机构:
[Wu, LJ ] C
Changsha Univ Sci & Technol, Sch Phys & Elect Sci, Hunan Prov Key Lab Flexible Elect Mat Genome Engn, Changsha 410114, Peoples R China.
语种:
英文
关键词:
Breakdown voltage;LDMOS;Multi -dimensional accumulation gate;Specific on -resistance
期刊:
Microelectronics Journal
ISSN:
0959-8324
年:
2023
卷:
138
页码:
105860
基金类别:
Hunan Provincial Natural Science Foundation of China [2021JJ30738]; Scientific Research Fund of Hunan Provincial Education Department [19K001]; Hunan Provincial Key Laboratory of Flexible Electronic Materials Genome Engineering's Open Fund Project-2020 [202016]
机构署名:
本校为第一且通讯机构
院系归属:
物理与电子科学学院
摘要:
A novel multi-dimensional accumulation gate (MDAG) lateral double-diffused MOS (LDMOS) with ultra-low specific on-resistance (Ron,sp) is proposed and investigated by simulation. The MDAG LDMOS is composed of the MDAG, the trench source, and the N-Buffer. In the on-state, the bulk electron channels are formed in the P -well and the multi-dimensional electron layers are formed in the drift region. Meanwhile, the trench source shortens the current path length. Thus, the Ron,sp is greatly reduced. In the off-state, the N-Buffer is used to form a PN junction with the P-Substrate to obtain the ideal...

反馈

验证码:
看不清楚,换一个
确定
取消

成果认领

标题:
用户 作者 通讯作者
请选择
请选择
确定
取消

提示

该栏目需要登录且有访问权限才可以访问

如果您有访问权限,请直接 登录访问

如果您没有访问权限,请联系管理员申请开通

管理员联系邮箱:yun@hnwdkj.com