The XRD, Raman and XPS analysises were used to investigate the crystalline phase and chemical states of Co3S4 nanowires, as shown in Fig. 1. In the XRD patterns of Co3S4 nanowires, the peaks at 31.5°, 38.1°, 50.2° and 55.3° were detected, which were well indexed to (3 1 1), (4 0 0), (5 1 1) and (4 4 0) planes of Co3S4 (JCPDS No. 42-1448), respectively. The two peaks at 44.8°and 52.1°were well matched the (1 1 1) and (2 0 0) planes of Ni foam substrate. No extra peaks were observed, suggesting the high