As microelectronics technology has continued to progress, the multiple-node upset (MNU), caused by the single-particle and charge-sharing effects, has gradually become one of the most important factors affecting chip reliability. To enhance the reliability of these latches, a TNU completely self-recoverable (TNUCR) latch is first proposed in this paper, mainly consisting of five interlocked four-input C-elements (CEs) and inverters, which are cross-connected to form a ring. For any individual CE, due to the presence of a feedback loop, the valu...
