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High-Performance Schottky-Barrier Field-Effect Transistors Based on Monolayer SiC Contacting Different Metals

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成果类型:
期刊论文
作者:
Xie, Hai-Qing;Li, Jie-Ying;Liu, Gang;Cai, Xi-Ya;Fan, Zhi-Qiang*
通讯作者:
Fan, Zhi-Qiang
作者机构:
[Liu, Gang; Cai, Xi-Ya; Xie, Hai-Qing; Li, Jie-Ying; Fan, Zhi-Qiang] Changsha Univ Sci & Technol, Sch Phys & Elect Sci, Changsha 410114, Hunan, Peoples R China.
[Xie, Hai-Qing; Fan, Zhi-Qiang] Changsha Univ Sci & Technol, Hunan Prov Key Lab Flexible Elect Mat Genome Engn, Changsha 410114, Hunan, Peoples R China.
通讯机构:
[Fan, Zhi-Qiang] C
Changsha Univ Sci & Technol, Sch Phys & Elect Sci, Changsha 410114, Hunan, Peoples R China.
语种:
英文
关键词:
Silicon carbide;Electrodes;Gold;Logic gates;Photonic band gap;Transistors;Density functional theory;field-effect transistor (FET);quantum transport;Schottky barrier;SiC
期刊:
IEEE Transactions On Electron Devices
ISSN:
0018-9383
年:
2019
卷:
66
期:
12
页码:
5111-5116
基金类别:
National Natural Science Foundation of ChinaNational Natural Science Foundation of China [61404011, 11674039]; Natural Science Foundation of Hunan ProvinceNatural Science Foundation of Hunan Province [2015JJ3001]; Scientific Research Fund of Hunan Provincial Education DepartmentHunan Provincial Education Department [17B007]
机构署名:
本校为第一且通讯机构
院系归属:
物理与电子科学学院
摘要:
Schottky-barrier field-effect transistors (SBFETs) based on monolayer SiC contacting four metals (Ag, Au, Al, and Pd) have been proposed using density functional theory and ab initio simulations. The n-type Schottky contacts could be formed between monolayer SiC and Ag, Au electrodes with electron Schottky barrier heights (SBHs) of 0.7 and 1.1 eV, respectively, whereas the p-type Schottky contacts were formed between monolayer SiC and Al, Pd electrodes with hole SBHs of 1.0 and 0.1 eV, respectively. When the gate length was equal to 5.1 nm, SiC...

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