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Study On Frequency Characteristics in Lateral PIN Photodiode Gated by Transparent Electrode Fabricated on Fully-Depleted Silicon-on-Insulator Film

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成果类型:
期刊论文
作者:
Xie, Hai-Qing*;Tang, Li-Jun;Tang, Jun-Long;Xiao, Zheng
通讯作者:
Xie, Hai-Qing
作者机构:
[Xiao, Zheng; Tang, Jun-Long; Xie, Hai-Qing; Tang, Li-Jun] Changsha Univ Sci & Technol, Sch Phys & Elect Sci, Changsha 410004, Hunan, Peoples R China.
通讯机构:
[Xie, Hai-Qing] C
Changsha Univ Sci & Technol, Sch Phys & Elect Sci, Changsha 410004, Hunan, Peoples R China.
语种:
英文
关键词:
FREQUENCY CHARACTERISTICS;LPIN PD-GTE;PHYSICAL MODEL;SOI
期刊:
JOURNAL OF NANOELECTRONICS AND OPTOELECTRONICS
ISSN:
1555-130X
年:
2014
卷:
9
期:
1
页码:
62-66
基金类别:
National Natural Science Foundation of ChinaNational Natural Science Foundation of China (NSFC) [11004018]; Scientific Research Fund of Hunan Provincial Education DepartmentHunan Provincial Education Department [12C0043]; Aid program for Science and Technology Innovative Research Team in Higher Educational Institutions of Hunan Province; construct program of the key discipline in Hunan province
机构署名:
本校为第一且通讯机构
院系归属:
物理与电子科学学院
摘要:
Frequency characteristics in lateral PIN photodiode gated by transparent electrode (LPIN PD-GTE) were studied by physical models and numerical simulation. In LPIN PD-GTE, due to vertically depletion in thin film by gate voltage, wider lateral depleted region and shorter transmit time were obtained than that in lateral PIN photodiode (LPIN PD) with the same parameters. Physical models and analysis for -3dB frequency, fT were presented and validated by ATLAS. Results indicate that the fT of LPIN PD-GTE at VGK = 0.6 V (fT = 30 MHz) is higher than that of LPIN PD (fT = 3 MHz) under the same parame...

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