期刊论文

Pan, XM

英文

Microelectronics Journal

0959-8324

2024

143

106050

10.1016/j.mejo.2023.106050

CRediT authorship contribution statement Weizheng Wang: Conceptualization, Methodology, Software, Investigation, Formal analysis, Writing – original draft. Jinhai Chen: Data curation, Writing – original draft. Xianmin Pan: Conceptualization, acquisition, Resources, Supervision, Writing – review & editing.

本校为第一机构

Scan testing is widely used in the rigorous testing of modern integrated circuits. However, the controllable and observable nature of the scan design also provides opportunities for attackers who can utilise this structure to steal secret information stored in the chip. This paper proposes a secure Design for Testability (DFT) architecture to prevent scan-based attacks. The scheme uses a modified Linear Feedback Shift Register (LFSR) to dynamically generate keys for the scan design key generator and verifies them against a specific selection of test key flip-flops in the original scan chain, a...