版权说明 操作指南
首页 > 成果 > 详情

Low On-State Voltage and EMI Noise 4H-SiC IGBT with Self-Biased Split-Gate pMOS

认领
导出
Link by DOI
反馈
分享
QQ微信 微博
成果类型:
期刊论文
作者:
Wu, Lijuan;Liu, Mengjiao;Zhang, Mengyuan;Liang, Jiahui;Yang, Gang;...
通讯作者:
Wu, L.
作者机构:
[Zhang, Tengfei; Liang, Jiahui; Wu, Lijuan; Zhang, Mengyuan; Liu, Qing; Yang, Gang; Liu, Mengjiao] Changsha Univ Sci & Technol, Sch Phys & Elect Sci, Hunan Prov Key Lab Flexible Elect Mat Genome Engn, Changsha 410114, Peoples R China.
通讯机构:
[Wu, L.] H
Hunan Provincial Key Laboratory of Flexible of Electronic Materials Genome Engineering, China
语种:
英文
关键词:
dIC/dt controllability;electromagnetic interference (EMI) noise;Miller capacitance (Cgc);on-state voltage (VON);split-gate pMOS (SGPMOS) insulated-gate bipolar transistor (IGBT)
期刊:
IEEE Transactions On Electron Devices
ISSN:
0018-9383
年:
2023
卷:
70
期:
2
页码:
647-652
基金类别:
10.13039/501100004735-Hunan Provincial Natural Science Foundation of China (Grant Number: 2021JJ30738) 10.13039/100009377-Scientific Research Fund of Hunan Provincial Education Department (Grant Number: 19K001) Hunan Provincial Key Laboratory of Flexible Electronic Materials Genome Engineering's Open Fund Project-2020 (Grant Number: 202016)
机构署名:
本校为第一机构
院系归属:
物理与电子科学学院
摘要:
A 15-kV-scale 4H-SiC insulated-gate bipolar transistor (IGBT) with a self-biased split-gate pMOS (SGPMOS) is proposed and simulated in this work. By introducing the SGPMOS, the proposed IGBT forms a hole barrier in the ON-state and a hole extraction path during the turn-on and turn-off transient, respectively. Compared to GS IGBT, the ON-state voltage ( ${V}_{\text {ON}}{)}$ of the SGPMOS IGBT is decreased by 54.95% for the same turn-off loss ( ${E}_{\text {off}}$ ). Meanwhile, compared with pMOS IGBT, the ${C}$ – ${V}$ and gate charge ( ${Q}_...

反馈

验证码:
看不清楚,换一个
确定
取消

成果认领

标题:
用户 作者 通讯作者
请选择
请选择
确定
取消

提示

该栏目需要登录且有访问权限才可以访问

如果您有访问权限,请直接 登录访问

如果您没有访问权限,请联系管理员申请开通

管理员联系邮箱:yun@hnwdkj.com