会议论文

Cai, S

英文

Proceedings of the Asian Test Symposium

1081-7735

2023

60-64

32nd IEEE Asian Test Symposium (ATS)

Asian Test Symposium Proceedings

OCT 14-17, 2023

Beijing, PEOPLES R CHINA

[Cai, Shuo;Ouyang, Jiangbiao;Wen, Yan;Wang, Weizheng;Yu, Fei] Changsha Univ Sci & Technol, Sch Comp & Commun Engn, Changsha, Peoples R China.

345 E 47TH ST, NEW YORK, NY 10017 USA

IEEE

979-8-3503-0310-0

10.1109/ATS59501.2023.10317975

National Natural Science Foundation of China (NSFC) [62172058]; Hunan Provincial Natural Science Foundation of China [2022JJ10052, 2022JJ30624]

本校为第一且通讯机构

With the continuous shrinking of the size of the semiconductor process, the multi-node upset (MNU) brought about by the charge-sharing effect in the nano-integrated circuit has a huge impact on the reliability of the chip. In this paper, a low-delay quadruple-node-upset self-recoverable (LDQNUSR) latch is proposed, which employs seven identical multi-level soft-error interception modules (SIM), each of which is composed of six two-input C-element (CEs) and an inverter. Due to the error interception characteristics of each SIM and the mutual feedback mechanism, this latch has complete quadruple...