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CTFTP: A Test Case Generation Strategy for General Boolean Expressions Based on Ordered Binary Label-Driven Petri Nets

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成果类型:
期刊论文
作者:
Gong, Hongfang*;Li, Junyi;Li, Renfa
通讯作者:
Gong, Hongfang
作者机构:
[Gong, Hongfang] Changsha Univ Sci & Technol, Sch Math & Stat, Changsha 410114, Peoples R China.
[Li, Junyi; Li, Renfa] Hunan Univ, Coll Comp Sci & Elect Engn, Changsha 410082, Hunan, Peoples R China.
通讯机构:
[Gong, Hongfang] C
Changsha Univ Sci & Technol, Sch Math & Stat, Changsha 410114, Peoples R China.
语种:
英文
关键词:
Petri nets;Fault detection;Test pattern generators;Boolean functions;Software;Licenses;Automatic test cases generation;fault-based testing;general Boolean expression test;ordered binary label-driven Petri net;path-oriented test criteria
期刊:
IEEE ACCESS
ISSN:
2169-3536
年:
2020
卷:
8
页码:
174516-174529
基金类别:
10.13039/501100001809-National Natural Science Foundation of China through the Key Project (Grant Number: 61932010) 10.13039/501100001809-National Natural Science Foundation of China (Grant Number: 61972055) 10.13039/100014472-Science Research Foundation (SRF) of Hunan Provincial Education Department of China through the Key Project (Grant Number: 18A145)
机构署名:
本校为第一且通讯机构
院系归属:
数学与统计学院
摘要:
Boolean expression testing requires certain types of tests for each Boolean expression in program specification or implementation. Fault-based testing essentially uses a subset of the exhaustive test set to detect certain special types of faults. A fault-based Boolean expression testing strategy called constraint true and false test point (CTFTP) is proposed. The test consists of two test case generation strategies, namely a unique constraint true point (UCTP) strategy and a near constraint false point (NCFP) strategy. An ordered binary label-driven Petri net model is presented to analyze the ...

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