版权说明 操作指南
首页 > 成果 > 详情

A Low-Loss 1.2 kV SiC MOSFET with Improved UIS Performance

认领
导出
Link by DOI
反馈
分享
QQ微信 微博
成果类型:
期刊论文
作者:
Wu, Lijuan;Zhang, Mengyuan;Liang, Jiahui;Liu, Mengjiao;Zhang, Tengfei;...
通讯作者:
Wu, LJ
作者机构:
[Zhang, Tengfei; Wu, LJ; Liang, Jiahui; Wu, Lijuan; Zhang, Mengyuan; Yang, Gang; Liu, Mengjiao] Changsha Univ Sci & Technol, Sch Phys & Elect Sci, Changsha 410114, Peoples R China.
通讯机构:
[Wu, LJ ] C
Changsha Univ Sci & Technol, Sch Phys & Elect Sci, Changsha 410114, Peoples R China.
语种:
英文
关键词:
bipolar degradation;silicon carbide (SiC) trench MOSFET;integrated low-barrier diode;unclamped inductive switching;switching loss
期刊:
Micromachines
ISSN:
2072-666X
年:
2023
卷:
14
期:
5
页码:
1061-
基金类别:
Methodology, L.W. and M.Z.; software, M.Z. and J.L.; validation, L.W.; formal analysis, M.L. and L.W.; investigation, L.W.; resources, L.W., M.Z. and J.L.; data curation, G.Y. and T.Z.; writing—original draft preparation, M.Z.; writing—review and editing, L.W. and M.Z.; visualization, M.Z.; supervision, L.W.; project administration, L.W.; funding acquisition, L.W. All authors have read and agreed to the published version of the manuscript. This work was supported in part by the Hunan Provincial Natural Science Foundation of China under Grant 2021JJ30738.
机构署名:
本校为第一且通讯机构
院系归属:
物理与电子科学学院
摘要:
In this article, a 1.2-kV-rated double-trench 4H-SiC MOSFET with an integrated low-barrier diode (DT-LBDMOS) is proposed which eliminates the bipolar degradation of the body diode and reduces switching loss while increasing avalanche stability. A numerical simulation verifies that a lower barrier for electrons appears because of the LBD; thus, a path that makes it easier for electrons to transfer from the N+ source to the drift region is provided, finally eliminating the bipolar degradation of the body diode. At the same time, the LBD integrate...

反馈

验证码:
看不清楚,换一个
确定
取消

成果认领

标题:
用户 作者 通讯作者
请选择
请选择
确定
取消

提示

该栏目需要登录且有访问权限才可以访问

如果您有访问权限,请直接 登录访问

如果您没有访问权限,请联系管理员申请开通

管理员联系邮箱:yun@hnwdkj.com