Soft Error Reliability Evaluation of Nanoscale Logic Circuits in the Presence of Multiple Transient Faults

首页 > 成果 > 详情

认领

导出

Link by 万方学术期刊

反馈

作者信息关键词期刊信息基础信息归属信息摘要

成果类型：

期刊论文

作者：

Cai, Shuo*;He, Binyong;Wang, Weizheng;Liu, Peng;Yu, Fei;...

通讯作者：

Cai, Shuo

作者机构：

[Cai, Shuo; He, Binyong; Wang, Weizheng; Yu, Fei] Changsha Univ Sci & Technol, Sch Comp & Commun Engn, Changsha 410114, Hunan, Peoples R China.

[Liu, Peng] Guangdong Univ Technol, Sch Comp, Guangzhou 510006, Guangdong, Peoples R China.

[Yin, Lairong] Changsha Univ Sci & Technol, Sch Automot & Mech Engn, Changsha 410114, Hunan, Peoples R China.

[Li, Bo] Chinese Acad Sci, Key Lab Silicon Device Technol, Inst Microelect, Beijing 100029, Peoples R China.

通讯机构：

[Cai, Shuo] C

Changsha Univ Sci & Technol, Sch Comp & Commun Engn, Changsha 410114, Hunan, Peoples R China.

语种：

英文

关键词：

Reliability evaluation;Multiple transient faults (MTFs);Bernoulli distribution;Fault simulation;Probability model

期刊：

JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS

ISSN：

0923-8174

年：

2020

卷：

期：

页码：

469-483

DOI：

10.1007/s10836-020-05898-x

基金类别：

National Natural Science Foundation of China (NSFC)National Natural Science Foundation of China [61702052, 61504013, 61804037]; Hunan Provincial Natural Science Foundation of ChinaNatural Science Foundation of Hunan Province [2020JJ4622, 2019JJ50648]; Scientific Research Fund of Hunan Provincial Education DepartmentHunan Provincial Education Department [18A137, 17B011]

机构署名：

本校为第一且通讯机构

院系归属：

汽车与机械工程学院

计算机与通信工程学院

摘要：

Radiation-induced single transient faults (STFs) are expected to evolve into multiple transient faults (MTFs) at nanoscale CMOS technology nodes. For this reason, the reliability evaluation of logic circuits in the presence of MTFs is becoming an important aspect of the design process of deep submicron and nanoscale systems. However, an accurate evaluation of the reliability of large-scale and very large-scale circuits is both very complex and time-consuming. Accordingly, this paper presents a novel soft error reliability calculation approach for logic circuits based on a probability distribut...

反馈

产权有误：本人成果被他人认领

数据有误：数据基本信息有误

归属有误：成果的院系归属、机构署名归属有误

其他原因：

验证码：

看不清楚，换一个

确定

取消

成果认领

标题：

用户	作者	通讯作者	--
	请选择	请选择	--

确定

取消

Soft Error Reliability Evaluation of Nanoscale Logic Circuits in the Presence of Multiple Transient Faults

反馈

成果认领

提示

该栏目需要登录且有访问权限才可以访问