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Modulation of SiCnw morphology on C/C composite surfaces by adjusting CVR process parameters

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成果类型:
期刊论文
作者:
Zhou, Zhe;Chen, Bin;Li, Sha;Liu, Jinao;Liu, Kuihong;...
通讯作者:
Mao, Weiguo;Dai, CY
作者机构:
[Zhou, Zhe; Liu, Kuihong; Dai, Cuiying; Fan, Zheqiong; Liu, Jinao; Chen, Bin; Mao, Weiguo; Wang, Jie] Changsha Univ Sci & Technol, Coll Mat Sci & Engn, Changsha 410114, Peoples R China.
[Zhou, Zhe; Liu, Kuihong; Dai, Cuiying; Fan, Zheqiong; Liu, Jinao; Chen, Bin; Mao, Weiguo; Wang, Jie] Key Lab Adv Coating Technol High end Equipment Hun, Changsha 410114, Peoples R China.
[Li, Sha; Zuo, Jinglv] Hunan Boyun New Mat Co Ltd, Changsha 410205, Peoples R China.
[Chen, Xi] Lingnan Univ, Sch Interdisciplinary Studies, Hong Kong, Peoples R China.
通讯机构:
[Mao, WG; Dai, CY ] C
Changsha Univ Sci & Technol, Coll Mat Sci & Engn, Changsha 410114, Peoples R China.
语种:
英文
关键词:
C/C composites;SiCnw;Morphology modulation;Growth mechanism
期刊:
Materials Today Communications
ISSN:
2352-4928
年:
2025
卷:
48
页码:
113415
基金类别:
CRediT authorship contribution statement Zhe Zhou: Writing – review & editing, Supervision, Resources. Xi Chen: Writing – review & editing. Cuiying Dai: Writing – review & editing, Supervision, acquisition. Jinglv Zuo: Writing – review & editing. Zheqiong Fan: Writing – review & editing. Jie Wang: Writing – review & editing. Weiguo Mao: Writing – review & editing, Supervision, acquisition. Kuihong Liu: Writing – review & editing. Jinao Liu: Writing – review & editing. Sha Li: Writing – review & editing. Bin Chen:
机构署名:
本校为第一且通讯机构
院系归属:
材料科学与工程学院
摘要:
SiCnw with special morphology, such as bamboo-like and beaded shapes, has better reinforcing effect on metal and ceramic-based composite coatings. In this study, SiCnw was prepared in situ on the surface of C/C composites by chemical vapor reaction (CVR) method using Si, SiO 2 and graphite as raw materials. The effects of heat treatment temperature, holding time and raw material ratio on the growth of SiCnw were investigated. The synthesized SiCnw is 3C-SiC with diameters between 100 nm and 300 nm and lengths up to tens of micrometers. Due to t...

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