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Effects of strain on Goos-Hänchen shifts of monolayer phosphorene

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成果类型:
期刊论文
作者:
Li, Kaihui;Cheng, Fang*
通讯作者:
Cheng, Fang
作者机构:
[Li, Kaihui; Cheng, Fang] Changsha Univ Sci & Technol, Dept Phys & Elect Sci, Changsha 410004, Hunan, Peoples R China.
通讯机构:
[Cheng, Fang] C
Changsha Univ Sci & Technol, Dept Phys & Elect Sci, Changsha 410004, Hunan, Peoples R China.
语种:
英文
期刊:
Physica E-Low-Dimensional Systems & Nanostructures
ISSN:
1386-9477
年:
2018
卷:
97
页码:
335-339
基金类别:
National Natural Science Foundation of ChinaNational Natural Science Foundation of China (NSFC) [11374002]; Scientific Research Fund of Hunan Provincial Education DepartmentHunan Provincial Education Department [17A001]; Science and Technology Innovative Research Team in Higher Educational Institutions of Hunan Province; construct program of the key discipline in hunan province
机构署名:
本校为第一且通讯机构
院系归属:
物理与电子科学学院
摘要:
We investigate the Goos-Hänchen(GH) shift for ballistic electrons (i) reflected from a step-like inhomogeneity of strain, and (ii) transmitted through a monolayer phosphoresce junction consisting of a positive strained region and two normal regions (or a normal region and two negative strained regions). Refraction occurs at the interface between the unstrained/positive-strain(negative-strain/unstrained), in analogy with optical refraction. The critical angle is different for different strengths and directions of the strains. The critical angles for electrons tunneling through unstrained/p...

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